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    IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV

    Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
    • 발행일 : 2011-05-11
    • 발행기관 : IEC
    • 대체표준 : IEC 61000-4-16:2015
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분야 TC 77/SC 77A : EMC - Low frequency phenomena
적용범위 IEC 61000-4-16:1998+A1:2001+A2:2009 Establishes a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. This standard defines test voltage and current waveform, range of test levels, test equipment, test set-up and test procedures. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to conducted, common mode disturbances such as those originating from power line currents and return leakage currents in the earthing/grounding system. This consolidated version consists of the first edition (1998), its amendment 1 (2001) and its amendment 2 (2009). Therefore, no need to order amendments in addition to this publication.
국제분류(ICS)코드 33.100.20 : 내성
페이지수 50
Edition 1.2

이력정보

No. 표준번호 표준명 발행일 상태
1 CSA IEC 61000-4-16:17 (R2022)상세보기 Electromagnetic compatibility (EMC) — Part 4-16: Testing and measurement techniques — Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz (Adopted IEC 61000-4-16:2015, second edition, 2015-12) | Compatibilité él 2017-01-01 표준
2 IEC 61000-4-16:2015상세보기 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2015-12-09 표준
3 IEC 61000-4-16:2015 RLV상세보기 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2015-12-09 표준
4 IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV상세보기 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2011-05-11 구판
5 IEC 61000-4-16:1998/AMD2:2009상세보기 Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2009-07-30 구판
6 IEC 61000-4-16:1998+AMD1:2001 CSV상세보기 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2002-07-12 구판
7 IEC 61000-4-16:1998/AMD1:2001상세보기 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 2001-07-11 구판
8 IEC 61000-4-16:1998상세보기 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz 1998-01-30 구판

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