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분야 TC 104 : Environmental conditions, classification and methods of test
적용범위 IEC 60068-1:2013 includes a series of methods for environmental testing along with their appropriate severities, and prescribes various atmospheric conditions for measurements and tests designed to assess the ability of specimens to perform under expected conditions of transportation, storage and all aspects of operational use. Although primarily intended for electrotechnical products, this standard is not restricted to them and may be used in other fields where desired. Other methods of environmental testing, specific to the individual types of specimen, may be included in the relevant specifications. The framework of environmental test tailoring process is given in order to assist the production of test specifications with appropriate tests and test severities. This seventh edition cancels and replaces the sixth edition, published in 1988, and constitutes a technical revision. The main changes with respect to the previous edition are listed below:
- updated normative reference list;
- indication of normative and informative annexes;
- new informative Annex C, Environmental test tailoring.
국제분류(ICS)코드 19.040 : 환경 시험
페이지수 62
Edition 7.0

이력정보

No. 표준번호 표준명 발행일 상태
1 IEC 60068-1:2013상세보기 Environmental testing - Part 1: General and guidance 2013-10-07 표준
2 IEC 60068-1:1988/AMD1:1992상세보기 Amendment 1 - Environmental testing. Part 1: General and guidance 1992-04-30 구판
3 IEC 60068-1:1988/COR1:1988상세보기 Corrigendum 1 - Environmental testing - Part 1: General and guidance 1988-10-01 구판
4 IEC 60068-1:1988상세보기 Environmental testing. Part 1: General and guidance 1988-06-30 구판
5 IEC 60068-1:1982상세보기 Basic environmental testing procedures - Part 1: General and guidance 1982-01-01 구판
6 IEC 60068-1:1978상세보기 Basic environmental testing procedures - Part 1: General 1978-01-01 구판
7 IEC 60068-1:1968/AMD1:1972상세보기 Amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 1: General 1972-12-31 구판
8 IEC 60068-1:1968상세보기 Basic environmental testing procedures for electronic components and electronic equipment - Part 1: General 1968-01-01 구판
9 IEC 60068-1:1960/AMD3:1965상세보기 Amendment 3 - Recommended basic climatic and mechanical robustness testing procedure for components for electronic equipment - Part 1: General 1965-04-30 구판
10 IEC 60068-1:1960/AMD2:1964상세보기 Amendment 2 - Recommended basic climatic and mechanical robustness testing procedure for components for electronic equipment - Part 1: General 1964-04-30 구판
11 IEC 60068-1:1960/AMD1:1963상세보기 Amendment 1 - Recommended basic climatic and mechanical robustness testing procedure for components for electronic equipment - Part 1: General 1963-12-31 구판
12 IEC 60068-1:1960상세보기 Recommended basic climatic and mechanical robustness testing procedure for components for electronic equipment - Part 1: General 1960-01-01 구판

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