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    IEC 61010-031:2022 CMV

    Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
    • 발행일 : 2022-12-22
    • 발행기관 : IEC
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    * RLV (Red-Line Version) : 구판과 최신판의 변경 사항을 빨간펜으로 표시해서 비교할 수 있게 만든 버전
    * CMV (Commented version) : 표준의 개정 시 변경 부분(레드라인)에 대한 코멘트(메모)가 추가된 버전
    * RLV 혹은 CMV를 구입하시면 최신판(Final version)은 별도로 구매하지 않아도 됩니다.

상세정보

분야
적용범위 IEC 61010-031:2022 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 61010-031:2022 edition 3.0 and the previous IEC 61010-031:2015+AMD1:2018 CSV edition 2.1. Furthermore, comments from IEC TC 66 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content.

IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment.

It has the status of a group safety publication in accordance with IEC Guide 104.

This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition:
  1. the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted;
  2. in Clause 2, normative references have been dated and new normative references have been added;
  3. in 3.1.4, the definition of probe tip has been modified;
  4. in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies;
  5. in 4.1 d) "Kelvin" probes have been added to the list of probe assemblies as a new Type E and a new Figure 5;
  6. in 4.1 e), probes for voltage measurement without electrical connection to conductors have been added to the list of probe assemblies as a new Type F and a new Figure 6;
  7. in 4.2.1, spread of fire is no longer considered as a hazard;
  8. Subclause 4.4.2.5 from Edition 2 has been deleted;
  9. Subclause 4.4.4.3 from Edition 2 has been deleted;
  10. in 5.4.4.1 consideration has been given to spacings and impedance;
  11. in 6.1.1, removable parts of probe tips which bear markings are allowed;
  12. in 6.1.5, the voltage to be marked for measurement categories is the AC line-to-neutral or DC voltage;
  13. in 7.4.2, requirements for unmated connectors have been modified as follows:
    1. Table 2 has been modified and expanded,
    2. a calculation method for clearances of connectors above 20 kV has been defined,
    3. creepage distances have been aligned with clearances;
  14. in 7.4.3.1 and 7.4.3.5, requirements for IP2X probe tips with retractable sleeve have been added;
  15. in 7.4.3.2, Probe tips are now applicable to non-contact probe assemblies;
  16. in 7.5.2.3.2, the values of Table 5 have been modified;
  17. in 7.6.2, voltage tests of clearances are done without humidity preconditioning;
  18. pre-treatments for rigidity test from Clause 10 of Edition 2 have been moved to 9.2;
  19. Subclause 11.1 of Edition 2 has been deleted;
  20. addition of an exception for Type E probe assembly in 13.2. Removable parts of probe tips which bear markings are allowed;
  21. Figure F.1 has been modified;
  22. Annex G has been added, for determination of clearances for Table 2;
  23. Annex H has been added, covering line-to-neutral voltages for common mains supply systems.
국제분류(ICS)코드 19.080 : 전기 및 전자 시험 및 측정기구
페이지수 312
Edition 3.0

이력정보

No. 표준번호 표준명 발행일 상태
1 IEC 61010-031:2022상세보기 Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement 2022-12-22 표준
2 IEC 61010-031:2022 CMV상세보기 Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement 2022-12-22 표준
3 IEC 61010-031:2015+AMD1:2018 CSV/COR1:2018상세보기 Corrigendum 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement 2018-08-06 구판
4 IEC 61010-031:2015/AMD1:2018상세보기 Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement. 2018-05-29 구판
5 IEC 61010-031:2015+AMD1:2018 CSV상세보기 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement 2018-05-29 구판
6 IEC 61010-031:2015 RLV상세보기 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test 2015-05-29 구판
7 IEC 61010-031:2015상세보기 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test 2015-05-29 구판
8 IEC 61010-031:2002+AMD1:2008 CSV상세보기 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test 2008-06-24 구판
9 IEC 61010-031:2002/AMD1:2008상세보기 Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test 2008-02-12 구판
10 IEC 61010-031:2002상세보기 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test 2002-01-10 구판

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