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    CAN/CSA-ISO/IEC 10373-6:18

    Identification cards - Test methods - Part 6: Proximity cards (Adopted ISO/IEC 10373-6:2016, third edition, 2016-07-15)
    • 발행일 : 2018-01-01
    • 발행기관 : CSA
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적용범위 Preface Standards development within the Information Technology sector is harmonized with international standards development. Through the CSA Technical Committee on Information Technology (TCIT), Canadians serve as the SCC Mirror Committee (SMC) on ISO/IEC Joint Technical Committee 1 on Information Technology (ISO/IEC JTC1) for the Standards Council of Canada (SCC), the ISO member body for Canada and sponsor of the Canadian National Committee of the IEC. Also, as a member of the International Telecommunication Union (ITU), Canada participates in the International Telegraph and Telephone Consultative Committee (ITU-T).? For brevity, this Standard will be referred to as "CAN/CSA-ISO/IEC 10373-6" throughout.? This Standard supersedes CAN/CSA-ISO/IEC 10373-6:12 (adopted ISO/IEC 10373-6:2011).? Scope ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.? NOTE 1 Criteria for acceptability do not form part of ISO/IEC 10373, but will be found in the International Standards mentioned above.? NOTE 2 Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately. A given proximity card or object, or proximity coupling device, is not required to pass through all the tests sequentially.? This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects, and proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443-1, ISO/IEC 14443-2, ISO/IEC 14443-3, and ISO/IEC 14443-4.? ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology-specific tests.
국제분류(ICS)코드
페이지수 229
Edition

이력정보

No. 표준번호 표준명 발행일 상태
1 ISO/IEC 10373-6:2025상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 2025-02-13 표준
2 ISO/IEC 10373-6:2025상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects 2025-02-13 표준
3 ISO/IEC 10373-6:2020/AMD1:2021상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management 2021-05-17 구판
4 ISO/IEC 10373-6:2020/Amd 1:2021상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management 2021-05-17 구판
5 CSA ISO/IEC 10373-6:21상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07) 2021-01-01 표준
6 ISO/IEC 10373-6:2020/AMD2:2020상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization 2020-11-27 구판
7 ISO/IEC 10373-6:2020/Amd 2:2020상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization 2020-11-27 구판
8 ISO/IEC 10373-6:2020상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects 2020-07-22 구판
9 ISO/IEC 10373-6:2020상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 2020-07-22 구판
10 ISO/IEC 10373-6:2016/Amd 3:2018상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect 2018-03-27 구판
11 ISO/IEC 10373-6:2016/AMD3:2018상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect 2018-03-27 구판
12 CAN/CSA-ISO/IEC 10373-6:18상세보기 Identification cards - Test methods - Part 6: Proximity cards (Adopted ISO/IEC 10373-6:2016, third edition, 2016-07-15) 2018-01-01 폐지
13 ISO/IEC 10373-6:2016상세보기 Identification cards — Test methods — Part 6: Proximity cards 2016-07-18 구판
14 ISO/IEC 10373-6:2016상세보기 Identification cards - Test methods - Part 6: Proximity cards 2016-07-18 구판
15 ISO/IEC 10373-6:2011/COR1:2013상세보기 Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement 2013-08-30 구판
16 ISO/IEC 10373-6:2011/Cor 1:2013상세보기 Identification cards — Test methods — Part 6: Proximity cards — Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement 2013-08-30 구판
17 ISO/IEC 10373-6:2011/AMD4:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes 2012-12-05 구판
18 ISO/IEC 10373-6:2011/Amd 4:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes 2012-12-05 구판
19 ISO/IEC 10373-6:2011/Amd 2:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance 2012-10-09 구판
20 ISO/IEC 10373-6:2011/AMD2:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance 2012-10-09 구판
21 ISO/IEC 10373-6:2011/AMD3:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 2012-07-24 구판
22 ISO/IEC 10373-6:2011/Amd 3:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 2012-07-24 구판
23 ISO/IEC 10373-6:2011/Amd 1:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes 2012-04-19 구판
24 ISO/IEC 10373-6:2011/AMD1:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes 2012-04-19 구판
25 ISO/IEC 10373-6:2011상세보기 Identification cards - Test methods - Part 6: Proximity cards 2011-01-07 구판
26 ISO/IEC 10373-6:2011상세보기 Identification cards — Test methods — Part 6: Proximity cards 2011-01-07 구판
27 ISO/IEC 10373-6:2001/AMD7:2010상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport 2010-03-10 구판
28 ISO/IEC 10373-6:2001/Amd 7:2010상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport 2010-03-10 구판
29 ISO/IEC 10373-6:2001/Amd 5:2007상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 2007-10-11 구판
30 ISO/IEC 10373-6:2001/AMD5:2007상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16 2007-10-11 구판
31 ISO/IEC 10373-6:2001/AMD1:2007상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards 2007-03-30 구판
32 ISO/IEC 10373-6:2001/Amd 1:2007상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards 2007-03-30 구판
33 ISO/IEC 10373-6:2001/Amd 3:2006상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices 2006-10-05 구판
34 ISO/IEC 10373-6:2001/AMD3:2006상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices 2006-10-05 구판
35 ISO/IEC 10373-6:2001/AMD4:2006상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure 2006-06-14 구판
36 ISO/IEC 10373-6:2001/Amd 4:2006상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure 2006-06-14 구판
37 ISO/IEC 10373-6:2001/AMD2:2003상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods 2003-10-10 구판
38 ISO/IEC 10373-6:2001/Amd 2:2003상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods 2003-10-10 구판
39 ISO/IEC 10373-6:2001상세보기 Identification cards — Test methods — Part 6: Proximity cards 2001-05-31 구판
40 ISO/IEC 10373-6:2001상세보기 Identification cards - Test methods - Part 6: Proximity cards 2001-05-31 구판
41 ISO/IEC 10373-6:2001/DAmd 8.2상세보기 Additional PICC classes 초안
42 ISO/IEC 10373-6:2011/DAmd 7상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Frame with error correction 폐지
43 ISO/IEC 10373-6:2016/DAmd 2상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Extension of PICC and PCD test methods 폐지
44 ISO/IEC 10373-6:2016/DAmd 4상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Conformance test plan 폐지
45 ISO/IEC 10373-6:2016/DAmd 5상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Clarification of test conditions for PICC reception 폐지

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