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    ISO/IEC 10373-6:2011/DAmd 7

    Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Frame with error correction
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상세정보

분야 ISO/IEC JTC 1/SC 17 : Cards and security devices for personal identification
적용범위
국제분류(ICS)코드 35.240.15 : 식별 카드 및 관련 장치
페이지수 9
Edition 2

이력정보

No. 표준번호 표준명 발행일 상태
1 ISO/IEC 10373-6:2025상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 2025-02-13 표준
2 ISO/IEC 10373-6:2025상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects 2025-02-13 표준
3 ISO/IEC 10373-6:2020/AMD1:2021상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 1: Dynamic power level management 2021-05-17 구판
4 ISO/IEC 10373-6:2020/Amd 1:2021상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management 2021-05-17 구판
5 CSA ISO/IEC 10373-6:21상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects (Adopted ISO/IEC 10373-6:2020, fourth edition, 2020-07) 2021-01-01 표준
6 ISO/IEC 10373-6:2020/AMD2:2020상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects - Amendment 2: Enhancements for harmonization 2020-11-27 구판
7 ISO/IEC 10373-6:2020/Amd 2:2020상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization 2020-11-27 구판
8 ISO/IEC 10373-6:2020상세보기 Cards and security devices for personal identification - Test methods - Part 6: Contactless proximity objects 2020-07-22 구판
9 ISO/IEC 10373-6:2020상세보기 Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects 2020-07-22 구판
10 ISO/IEC 10373-6:2016/Amd 3:2018상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: PICC loading effect 2018-03-27 구판
11 ISO/IEC 10373-6:2016/AMD3:2018상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: PICC loading effect 2018-03-27 구판
12 CAN/CSA-ISO/IEC 10373-6:18상세보기 Identification cards - Test methods - Part 6: Proximity cards (Adopted ISO/IEC 10373-6:2016, third edition, 2016-07-15) 2018-01-01 폐지
13 ISO/IEC 10373-6:2016상세보기 Identification cards — Test methods — Part 6: Proximity cards 2016-07-18 구판
14 ISO/IEC 10373-6:2016상세보기 Identification cards - Test methods - Part 6: Proximity cards 2016-07-18 구판
15 ISO/IEC 10373-6:2011/COR1:2013상세보기 Identification cards - Test methods - Part 6: Proximity cards - Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement 2013-08-30 구판
16 ISO/IEC 10373-6:2011/Cor 1:2013상세보기 Identification cards — Test methods — Part 6: Proximity cards — Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurement 2013-08-30 구판
17 ISO/IEC 10373-6:2011/AMD4:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes 2012-12-05 구판
18 ISO/IEC 10373-6:2011/Amd 4:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes 2012-12-05 구판
19 ISO/IEC 10373-6:2011/Amd 2:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance 2012-10-09 구판
20 ISO/IEC 10373-6:2011/AMD2:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Test methods for electromagnetic disturbance 2012-10-09 구판
21 ISO/IEC 10373-6:2011/AMD3:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 2012-07-24 구판
22 ISO/IEC 10373-6:2011/Amd 3:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2 2012-07-24 구판
23 ISO/IEC 10373-6:2011/Amd 1:2012상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes 2012-04-19 구판
24 ISO/IEC 10373-6:2011/AMD1:2012상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Additional PICC classes 2012-04-19 구판
25 ISO/IEC 10373-6:2011상세보기 Identification cards - Test methods - Part 6: Proximity cards 2011-01-07 구판
26 ISO/IEC 10373-6:2011상세보기 Identification cards — Test methods — Part 6: Proximity cards 2011-01-07 구판
27 ISO/IEC 10373-6:2001/AMD7:2010상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport 2010-03-10 구판
28 ISO/IEC 10373-6:2001/Amd 7:2010상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport 2010-03-10 구판
29 ISO/IEC 10373-6:2001/Amd 5:2007상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 2007-10-11 구판
30 ISO/IEC 10373-6:2001/AMD5:2007상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 5: Bit rates of fc/64, fc/32 and fc/16 2007-10-11 구판
31 ISO/IEC 10373-6:2001/AMD1:2007상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 1: Protocol test methods for proximity cards 2007-03-30 구판
32 ISO/IEC 10373-6:2001/Amd 1:2007상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards 2007-03-30 구판
33 ISO/IEC 10373-6:2001/Amd 3:2006상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices 2006-10-05 구판
34 ISO/IEC 10373-6:2001/AMD3:2006상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 3: Protocol test methods for proximity coupling devices 2006-10-05 구판
35 ISO/IEC 10373-6:2001/AMD4:2006상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure 2006-06-14 구판
36 ISO/IEC 10373-6:2001/Amd 4:2006상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure 2006-06-14 구판
37 ISO/IEC 10373-6:2001/AMD2:2003상세보기 Identification cards - Test methods - Part 6: Proximity cards - Amendment 2: Improved RF test methods 2003-10-10 구판
38 ISO/IEC 10373-6:2001/Amd 2:2003상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods 2003-10-10 구판
39 ISO/IEC 10373-6:2001상세보기 Identification cards — Test methods — Part 6: Proximity cards 2001-05-31 구판
40 ISO/IEC 10373-6:2001상세보기 Identification cards - Test methods - Part 6: Proximity cards 2001-05-31 구판
41 ISO/IEC 10373-6:2001/DAmd 8.2상세보기 Additional PICC classes 초안
42 ISO/IEC 10373-6:2011/DAmd 7상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Frame with error correction 폐지
43 ISO/IEC 10373-6:2016/DAmd 2상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Extension of PICC and PCD test methods 폐지
44 ISO/IEC 10373-6:2016/DAmd 4상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Conformance test plan 폐지
45 ISO/IEC 10373-6:2016/DAmd 5상세보기 Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Clarification of test conditions for PICC reception 폐지

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