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IEC 61000-4-6:2023
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields- 발행일 : 2023-06-06
- 발행기관 : IEC
상세정보
분야 | TC 77/SC 77B : High frequency phenomena |
---|---|
적용범위 | IEC 61000-4-6: 2023 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up to 230 MHz (see Annex B) although the methods and test instrumentation are intended to be used in the frequency range up to 80 MHz. Equipment not having at least one conducting wire or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this document. NOTE 2 Test methods are specified in this part of IEC 61000 to assess the effect that conducted disturbing signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods specified are structured for the primary objective of establishing adequate repeatability of results at various facilities for quantitative analysis of effects. The object of this document is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method in this document describes a consistent method to assess the immunity of an equipment or system against a specified phenomenon. NOTE 3 As described in IEC Guide 107, this document is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. This fifth edition cancels and replaces the fourth edition published in 2013. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) selection of injection devices revised; b) need of AE impedance check for clamp injection removed and Annex H deleted; c) saturation check revised; d) new Annex H on testing with multiple signals; e) level-setting only with feedback loop. |
국제분류(ICS)코드 | 33.100.20 : 내성 |
페이지수 | 184 |
Edition | 5.0 |
이력정보
No. | 표준번호 | 표준명 | 발행일 | 상태 |
---|---|---|---|---|
1 | IEC 61000-4-6:2023상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2023-06-06 | 표준 |
2 | IEC 61000-4-6:2023 RLV상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2023-06-06 | 표준 |
3 | IEC 61000-4-6:2013/COR1:2015상세보기 | Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2015-06-12 | 구판 |
4 | CAN/CSA-IEC 61000-4-6:15 (R2023)상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radiofrequency fields (Adopted IEC 61000-4-6:2013, fourth edition, 2013-10) | Compatibilité électromagnétique (CEM) - Parti | 2015-01-01 | 표준 |
5 | IEC 61000-4-6:2013상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2013-10-23 | 구판 |
6 | IEC 61000-4-6:2008상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2008-10-31 | 구판 |
7 | IEC 61000-4-6:2008 RLV상세보기 | Electromagnetic compatibility (EMC) – Part 4-6: Testing and measurement techniques – Immunity to conducted disturbances, induced by radio-frequency fields | 2008-10-01 | 구판 |
8 | IEC 61000-4-6:2003+AMD1:2004+AMD2:2006 CSV상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2006-05-22 | 구판 |
9 | IEC 61000-4-6:2003/AMD2:2006상세보기 | Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2006-03-20 | 구판 |
10 | IEC 61000-4-6:2003+AMD1:2004 CSV상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2004-11-24 | 구판 |
11 | IEC 61000-4-6:2003/AMD1:2004상세보기 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2004-10-12 | 구판 |
12 | IEC 61000-4-6:2003상세보기 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2003-05-27 | 구판 |
13 | IEC 61000-4-6:1996+AMD1:2000 CSV상세보기 | Electromagnetic compatibility (EMC)- Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | 2001-04-26 | 구판 |
14 | IEC 61000-4-6:1996/AMD1:2000상세보기 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields | 2000-11-09 | 구판 |
15 | IEC 61000-4-6:1996/COR1:1996상세보기 | Corrigendum to IEC 1000-4-6 | 1996-10-17 | 구판 |
16 | IEC 61000-4-6:1996상세보기 | Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields | 1996-04-04 | 구판 |
관련상품
- IEC TR 61000-2-1:1990 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems
- IEC TR 61000-2-3:1992 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena
- IEC 61000-4-12:1995 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 12: Oscillatory waves immunity test. Basic EMC Publication
- IEC TR 61000-2-6:1995 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 6: Assessment of the emission levels in the power supply of industrial plants as regards low-frequency conducted disturbances
- IEC 61000-5-5:1996 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 5: Specification of protective devices for HEMP conducted disturbance. Basic EMC Publication
다른 사람이 함께 구입한 상품
- IEC 61000-4-3:2020 - Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
- IEC 61000-4-8:2009 - Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
- IEC 61000-4-4:2012 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
- IEC 61000-4-11:2020 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
- IEC 61000-4-29:2000 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
추천 상품
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- KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스
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