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IEC 61000-4-11:2020
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase- 발행일 : 2020-01-28
- 발행기관 : IEC
상세정보
| 분야 | TC 77/SC 77A : EMC - Low frequency phenomena |
|---|---|
| 적용범위 | IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - rise time and fall time of transients are now defined terms in Clause 3; - the origin of voltage dips and short interruptions is now stated in Clause 4. The contents of the corrigendum of May 2020 and October 2022 have been included in this copy. |
| 국제분류(ICS)코드 | 33.100.20 : 내성 |
| 페이지수 | 62 |
| Edition | 3.0 |
이력정보
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 61000-4-11:2020/COR2:2022상세보기 | Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2022-10-13 | 표준 |
| 2 | CSA IEC 61000-4-11:22상세보기 | Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase (Adopted IEC 61000-4-11:2020, third edition | 2022-01-01 | 표준 |
| 3 | IEC 61000-4-11:2020/COR1:2020상세보기 | Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-05-28 | 표준 |
| 4 | IEC 61000-4-11:2020상세보기 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-01-28 | 표준 |
| 5 | IEC 61000-4-11:2020 RLV상세보기 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-01-28 | 표준 |
| 6 | CSA IEC 61000-4-11:19상세보기 | Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests (Adopted IEC 61000-4-11:2004, edition 2:2004, consolidated with amendment 1:2017) | Compatibilité | 2019-01-01 | 폐지 |
| 7 | IEC 61000-4-11:2004+AMD1:2017 CSV상세보기 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2017-05-18 | 구판 |
| 8 | IEC 61000-4-11:2004/AMD1:2017상세보기 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2017-05-18 | 구판 |
| 9 | IEC 61000-4-11:2004상세보기 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2004-03-24 | 구판 |
| 10 | IEC 61000-4-11:1994+AMD1:2000 CSV상세보기 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2001-03-28 | 구판 |
| 11 | IEC 61000-4-11:1994/AMD1:2000상세보기 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests | 2000-11-09 | 구판 |
| 12 | IEC 61000-4-11:1994상세보기 | Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests | 1994-06-16 | 구판 |
관련상품
- IEC TR 61000-2-1:1990 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems
- IEC TR 61000-2-3:1992 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena
- IEC 61000-4-12:1995 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 12: Oscillatory waves immunity test. Basic EMC Publication
- IEC TR 61000-2-6:1995 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 6: Assessment of the emission levels in the power supply of industrial plants as regards low-frequency conducted disturbances
- IEC 61000-5-5:1996 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 5: Specification of protective devices for HEMP conducted disturbance. Basic EMC Publication
다른 사람이 함께 구입한 상품
- IEC 61000-4-4:2012 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
- IEC 61000-4-2:2008 - Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
- IEC 61000-4-6:2013 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
- IEC 61000-4-5:2014 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
- IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV - Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
추천 상품
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