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    IEC 61000-4-11:2004

    Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
    • 발행일 : 2004-03-24
    • 발행기관 : IEC
    • 대체표준 : IEC 61000-4-11:2020
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분야 TC 77/SC 77A : EMC - Low frequency phenomena
적용범위 This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks. It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks. Tests for these networks will be covered by future IEC standards. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. This second edition cancels and replaces the first edition published in 1994 and its amendment 1 (2000). This second edition constitutes a technical revision in which 1) preferred test values and durations have been added for the different environment classes; 2) the tests for the three-phase systems have been specified. It has the status of a Basic EMC Publication in accordance with IEC Guide 107. The contents of the interpretation sheet 1 of August 2010 have been included in this copy.
국제분류(ICS)코드 33.100.20 : 내성
페이지수 51
Edition 2.0

이력정보

No. 표준번호 표준명 발행일 상태
1 IEC 61000-4-11:2020/COR2:2022상세보기 Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase 2022-10-13 표준
2 CSA IEC 61000-4-11:22상세보기 Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase (Adopted IEC 61000-4-11:2020, third edition 2022-01-01 표준
3 IEC 61000-4-11:2020/COR1:2020상세보기 Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase 2020-05-28 표준
4 IEC 61000-4-11:2020상세보기 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase 2020-01-28 표준
5 IEC 61000-4-11:2020 RLV상세보기 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase 2020-01-28 표준
6 CSA IEC 61000-4-11:19상세보기 Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests (Adopted IEC 61000-4-11:2004, edition 2:2004, consolidated with amendment 1:2017) | Compatibilité 2019-01-01 폐지
7 IEC 61000-4-11:2004+AMD1:2017 CSV상세보기 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 2017-05-18 구판
8 IEC 61000-4-11:2004/AMD1:2017상세보기 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 2017-05-18 구판
9 IEC 61000-4-11:2004상세보기 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 2004-03-24 구판
10 IEC 61000-4-11:1994+AMD1:2000 CSV상세보기 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests 2001-03-28 구판
11 IEC 61000-4-11:1994/AMD1:2000상세보기 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests 2000-11-09 구판
12 IEC 61000-4-11:1994상세보기 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests 1994-06-16 구판

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