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Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase (Adopted IEC 61000-4-11:2020, third edition
| 분야 | 11 : LG Electronics |
|---|---|
| 적용범위 | |
| 국제분류(ICS)코드 | |
| 페이지수 | 89 |
| Edition |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 61000-4-11:2020/COR2:2022 | Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2022-10-13 | 표준 |
| 2 | CSA IEC 61000-4-11:22 | Electromagnetic compatibility (EMC) — Part 4-11: Testing and measurement techniques — Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase (Adopted IEC 61000-4-11:2020, third edition | 2022-01-01 | 표준 |
| 3 | IEC 61000-4-11:2020/COR1:2020 | Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-05-28 | 표준 |
| 4 | IEC 61000-4-11:2020 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-01-28 | 표준 |
| 5 | IEC 61000-4-11:2020 RLV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase | 2020-01-28 | 표준 |
| 6 | IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2017-05-18 | 구판 |
| 7 | IEC 61000-4-11:2004/AMD1:2017 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2017-05-18 | 구판 |
| 8 | IEC 61000-4-11:2004 | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2004-03-24 | 구판 |
| 9 | IEC 61000-4-11:1994+AMD1:2000 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | 2001-03-28 | 구판 |
| 10 | IEC 61000-4-11:1994/AMD1:2000 | Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests | 2000-11-09 | 구판 |
| 11 | IEC 61000-4-11:1994 | Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests | 1994-06-16 | 구판 |
IEC TR 61000-2-1:1990 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems 상세보기
IEC TR 61000-2-3:1992 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena 상세보기
IEC 61000-4-12:1995 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 12: Oscillatory waves immunity test. Basic EMC Publication 상세보기
IEC TR 61000-2-6:1995 - Electromagnetic compatibility (EMC) - Part 2: Environment - Section 6: Assessment of the emission levels in the power supply of industrial plants as regards low-frequency conducted disturbances 상세보기
IEC 61000-5-5:1996 - Electromagnetic compatibility (EMC) - Part 5: Installation and mitigation guidelines - Section 5: Specification of protective devices for HEMP conducted disturbance. Basic EMC Publication 상세보기
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